OSAI MEMS Conditioning Lab Equipment

OSAI MEMS Conditioning Lab Equipment

Universal desktop MEMS stimulation and test solution

OSAI neoPLACE Handler

OSAI neoPLACE Handler

Universal Handler for Semiconductors and PCB

OSAI neoMARK (LASER marking)

Innovative solutions for Electronic Manufacturing

OSAI neoMARK (LASER marking)
COMBI-TESTER FOR IN CIRCUIT TEST AND FUNCTION TEST

COMBI-TESTER FOR IN CIRCUIT TEST AND FUNCTION TEST

High speed and high precision ICT. Easy expansion and integration of 3rd party instrumentation.

UNIQUE PXI HIGH PRECISION INCIRCUIT TEST SOLUTION

UNIQUE PXI HIGH PRECISION INCIRCUIT TEST SOLUTION

Scalable test system, Power supplies for power up the PCB, Function Test

 Z1 – HIGH SPEED, HIGH PRECISION PARALLEL ICT SYSTEM

Z1 – HIGH SPEED, HIGH PRECISION PARALLEL ICT SYSTEM

Board Test: In Circuit Test, Boundary Scan, Funktional Test, Combi Test

UNIQUE SCALABLE SOC TEST SOLUTION

Ultra compact, multi site, wafer and final test, 10GBit data transfer rate, smallest ATE module form factor, VHDL programming …

UNIQUE SCALABLE SOC TEST SOLUTION
UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

UNIQUE BOARD REPAIR & DIAGNOSTIC TEST SOLUTION

Digital/analog/mixed signal, VHDL device library, guided Probe back-tracking, QSM-VI signature analysis, automatic fault simulation, circuit tracer …

Testimonials
Testimonials

What others have to say about us

CitationInstant sales coverage on discretes static and dynamic test markets with strong customer relationship, network and background of ATE business fills our gap in sales and sales support. For a unique new product series like our MDT systems family, ATEip provides a solution to add sales power with no fix cost .
Mauro Serra, Project and Sales Manager CREA Test CREA Test

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